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1 article(s) from Yacoot, Andrew

Evaluation of preparation methods for suspended nano-objects on substrates for dimensional measurements by atomic force microscopy

Petra Fiala,
Daniel Göhler,
Benno Wessely,
Michael Stintz,
Giovanni Mattia Lazzerini and
Andrew Yacoot

Beilstein J. Nanotechnol. 2017, 8, 1774–1785, doi:10.3762/bjnano.8.179

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Figure 1: Theoretical surface-specific numbers of deposited particles (for quadratic packing) in dependence o...

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Figure 2: SEM images of a) spherical Au particles (60 nm) and b) Au rods (25 × 77 nm) prepared on track etchi...

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Figure 3: SEM images of a) spherical Au particles (60 nm) and b) Au rods (25 × 77 nm) prepared on Si wafers b...

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Figure 4: SEM images of a) spherical Ag particles (50 nm) and b) fractal TiO₂ particles (<150 nm) prepared on...

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Figure 5: SEM overview image of spherical SiO₂ particles (100 nm) prepared on Si waver by conventional drop-d...

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Figure 6: SEM images of spherical SiO₂ particles (100 nm) prepared on Si wafers by a) conventional drop-dryin...

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Figure 7: SEM images of spherical SiO₂ particles (100 nm) and b) fractal TiO₂ particles (<150 nm) prepared on...

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Figure 8: AFM analyses: a) AFM image and b) distribution of measured heights for spherical SiO₂ particles (10...

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Published 28 Aug 2017

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